Genetic programming modelling for the electrical resistivity of Cu–Zn thin films
Crossref DOI link: https://doi.org/10.1007/s12043-018-1613-2
Published Online: 2018-08-01
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Karahan, İsmail Hakki http://orcid.org/0000-0002-8297-3521
Ozdemir, Rasim
Text and Data Mining valid from 2018-08-01
Article History
Received: 16 January 2018
Revised: 28 February 2018
Accepted: 1 March 2018
First Online: 1 August 2018