Assessment of printability for printed electronics patterns by measuring geometric dimensions and defining assessment parameters
Crossref DOI link: https://doi.org/10.1007/s12206-016-1131-4
Published Online: 2016-12-15
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jeon, Sung Woong
Kim, Cheol
Kim, Chung Hwan
License valid from 2016-12-01