Interferometric profilometry of absolute optical thickness of transparent plate using wavelength tuning fringe analysis
Crossref DOI link: https://doi.org/10.1007/s12206-019-0531-7
Published Online: 2019-06-10
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Yangjin
Text and Data Mining valid from 2019-06-01
Version of Record valid from 2019-06-01
Article History
Received: 3 November 2018
Revised: 24 March 2019
Accepted: 25 March 2019
First Online: 10 June 2019