Distance dependence of atomic-resolution near-field imaging on α-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip
Crossref DOI link: https://doi.org/10.1007/s12274-015-0934-4
Published Online: 2015-12-09
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yamanishi, Junsuke
Tokuyama, Takashi
Naitoh, Yoshitaka
Li, Yan Jun
Sugawara, Yasuhiro
Text and Data Mining valid from 2015-12-09