Temperature- and thickness-dependence of robust out-of-plane ferroelectricity in CVD grown ultrathin van der Waals α-In2Se3 layers
Crossref DOI link: https://doi.org/10.1007/s12274-020-2640-0
Published Online: 2020-01-15
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Io, Weng Fu
Yuan, Shuoguo
Pang, Sin Yi
Wong, Lok Wing
Zhao, Jiong
Hao, Jianhua
Text and Data Mining valid from 2020-01-15
Version of Record valid from 2020-01-15
Article History
Received: 24 November 2019
Revised: 18 December 2019
Accepted: 2 January 2020
First Online: 15 January 2020