Fast defect detection for various types of surfaces using random forest with VOV features
Crossref DOI link: https://doi.org/10.1007/s12541-015-0125-y
Published Online: 2015-05-15
Published Print: 2015-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kwon, Bae-Keun
Won, Jong-Seob
Kang, Dong-Joong
Text and Data Mining valid from 2015-05-01