Robust defect detection method for a non-periodic TFT-LCD pad area
Crossref DOI link: https://doi.org/10.1007/s12541-017-0128-y
Published Online: 2017-08-08
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Jeong-Yun
Kim, Tai-Wook
Pahk, Heui Jae
License valid from 2017-08-01