Active Contour Method Based Sub-pixel Critical Dimension Measurement of Thin Film Transistor Liquid Crystal Display (TFT-LCD) Patterns
Crossref DOI link: https://doi.org/10.1007/s12541-019-00314-7
Published Online: 2020-01-10
Published Print: 2020-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Jeong Hoon
Kim, Tai-Wook http://orcid.org/0000-0002-2853-9329
Ku, Dong Hun
Pahk, Heui Jae
Text and Data Mining valid from 2020-01-10
Version of Record valid from 2020-01-10
Article History
Received: 8 August 2019
Revised: 30 December 2019
Accepted: 30 December 2019
First Online: 10 January 2020