Characteristics of atomic layer deposited transparent aluminum-doped zinc oxide thin films at low temperature
Crossref DOI link: https://doi.org/10.1007/s12598-015-0460-2
Published Online: 2015-02-27
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhao, Fei-Long
Dong, Jun-Chen
Zhao, Nan-Nan
Wu, Jing
Han, De-Dong
Kang, Jin-Feng
Wang, Yi
Text and Data Mining valid from 2015-02-27