Ultra-Thin High-K Dielectric Profile Based NBTI Compact Model for Nanoscale Bulk MOSFET
Crossref DOI link: https://doi.org/10.1007/s12633-018-9984-z
Published Online: 2018-09-25
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Swami, Yashu http://orcid.org/0000-0002-1730-3281
Rai, Sanjeev
Text and Data Mining valid from 2018-09-25
Article History
Received: 27 June 2018
Accepted: 17 September 2018
First Online: 25 September 2018