3D Investigation of 8-nm Tapered n-FinFET Model
Crossref DOI link: https://doi.org/10.1007/s12633-019-00253-y
Published Online: 2019-09-02
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Boukortt, N. http://orcid.org/0000-0001-9517-9063
Patanè, S.
Crupi, G.
Text and Data Mining valid from 2019-09-02
Version of Record valid from 2019-09-02
Article History
Received: 21 March 2019
Accepted: 20 August 2019
First Online: 2 September 2019