Interface Trap Charge Induced Threshold Voltage Modeling of WFE High-K SOI MOSFET
Crossref DOI link: https://doi.org/10.1007/s12633-020-00386-5
Published Online: 2020-01-27
Published Print: 2020-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Saha, Priyanka http://orcid.org/0000-0002-9942-7981
Banerjee, Pritha
Dash, Dinesh Kumar
Sarkar, Subir Kumar
Text and Data Mining valid from 2020-01-27
Version of Record valid from 2020-01-27
Article History
Received: 12 September 2019
Accepted: 9 January 2020
First Online: 27 January 2020