A Study on Dual Dielectric Pocket Heterojunction SOI Tunnel FET Performance and Flicker Noise Analysis in Presence of Interface Traps
Crossref DOI link: https://doi.org/10.1007/s12633-020-00488-0
Published Online: 2020-05-08
Published Print: 2021-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Das, Debika
Chakraborty, Ujjal
Text and Data Mining valid from 2020-05-08
Version of Record valid from 2020-05-08
Article History
Received: 18 December 2019
Accepted: 13 April 2020
First Online: 8 May 2020