An Accurate Model for Threshold Voltage Analysis of Dual Material Double Gate Metal Oxide Semiconductor Field Effect Transistor
Crossref DOI link: https://doi.org/10.1007/s12633-020-00553-8
Published Online: 2020-07-09
Published Print: 2021-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chakrabarti, Himeli
Maity, Reshmi
Baishya, S.
Maity, N. P. http://orcid.org/0000-0002-1256-5856
Text and Data Mining valid from 2020-07-09
Version of Record valid from 2020-07-09
Article History
Received: 24 March 2020
Accepted: 11 June 2020
First Online: 9 July 2020