Back Bias Induced Modeling of Subthreshold Characteristics of SOI Junctionless Field Effect Transistor (JLFET)
Crossref DOI link: https://doi.org/10.1007/s12633-020-00590-3
Published Online: 2020-07-14
Published Print: 2021-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dixit, Vijay Kumar
Gupta, Rajeev
Srinivas, P S T N
Dubey, Sarvesh http://orcid.org/0000-0001-8377-5722
Text and Data Mining valid from 2020-07-14
Version of Record valid from 2020-07-14
Article History
Received: 25 April 2020
Accepted: 7 July 2020
First Online: 14 July 2020