Performance Tuning and Reliability Analysis of the Electrostatically Configured Nanotube Tunnel FET with Impact of Interface Trap Charges
Crossref DOI link: https://doi.org/10.1007/s12633-020-00777-8
Published Online: 2020-10-22
Published Print: 2021-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gupta, Ashok Kumar
Raman, Ashish
Kumar, Naveen
Text and Data Mining valid from 2020-10-22
Version of Record valid from 2020-10-22
Article History
Received: 6 September 2020
Accepted: 12 October 2020
First Online: 22 October 2020