A New Technique to Improve Breakdown Voltage of SOI LDMOSs: Multiple Diode Wells
Crossref DOI link: https://doi.org/10.1007/s12633-021-01354-3
Published Online: 2021-09-06
Published Print: 2022-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gavoshani, Amir
Dehghan, Mostafa
Orouji, Ali A. http://orcid.org/0000-0002-8664-6069
Text and Data Mining valid from 2021-09-06
Version of Record valid from 2021-09-06
Article History
Received: 12 July 2021
Accepted: 24 August 2021
First Online: 6 September 2021
Declarations
:
: Not applicable.
: The authors declare that they have no conflict of interest.