Swift heavy ion irradiation and annealing studies on the I–V characteristics of N-channel depletion Metal–oxide–semiconductor field-effect transistors
Crossref DOI link: https://doi.org/10.1007/s12648-015-0659-y
Published Online: 2015-04-28
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pushpa, N.
Gnana Prakash, A. P.
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