X-ray Diffraction for the Determination of Residual Stress of Crystalline Material: An Overview
Crossref DOI link: https://doi.org/10.1007/s12666-022-02540-6
Published Online: 2022-03-07
Published Print: 2022-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lodh, Arijit
Thool, Khushahal
Samajdar, Indradev
Text and Data Mining valid from 2022-03-07
Version of Record valid from 2022-03-07
Article History
Received: 9 November 2021
Accepted: 20 January 2022
First Online: 7 March 2022