Self-Assembly of Pentacene on Sub-nm Scale Surface Roughness-Controlled Gate Dielectrics
Crossref DOI link: https://doi.org/10.1007/s13233-018-6129-6
Published Online: 2018-07-06
Published Print: 2018-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pei, Mingyuan
Ko, Joong Se
Shin, Hwanho
Cho, Minsang
Baek, Jimin
Kim, Gyudong
Youk, Ji Ho
Yang, Hoichang
Text and Data Mining valid from 2018-07-06
Article History
Received: 16 March 2018
Revised: 24 April 2018
Accepted: 24 April 2018
First Online: 6 July 2018