Leakage current behavior in MIM capacitors and MISM organic capacitors with a thin AlOx insulator
Crossref DOI link: https://doi.org/10.1007/s13391-014-4190-7
Published Online: 2015-03-10
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Jae-Hyun
Bae, Jin-Hyuk
Kim, Min-Hoi
Text and Data Mining valid from 2015-03-01