Thickness dependent study of RF sputtered ZnO thin films for optoelectronic device applications
Crossref DOI link: https://doi.org/10.1007/s13391-015-4445-y
Published Online: 2015-10-28
Published Print: 2015-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sharma, Shashikant
Periasamy, C.
Chakrabarti, P.
Text and Data Mining valid from 2015-10-28