In-situ XPS study of ALD ZnO passivation of p-In0.53Ga0.47As
Crossref DOI link: https://doi.org/10.1007/s13391-015-5150-6
Published Online: 2015-09-10
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lucero, Antonio T.
Byun, Young-Chul
Qin, Xiaoye
Cheng, Lanxia
Kim, Hyoungsub
Wallace, Robert M.
Kim, Jiyoung
Text and Data Mining valid from 2015-09-01