Noninvasive thickness measurements of metal films through microwave dielectric resonators
Crossref DOI link: https://doi.org/10.1007/s13391-016-6060-y
Published Online: 2016-05-10
Published Print: 2016-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jung, Ho Sang
Lee, Jae Hun
Han, Hyun Kyung
Lee, Sang Young
Text and Data Mining valid from 2016-05-01