Gate Architecture Effects on the Gate Leakage Characteristics of GaN Wrap-gate Nanowire Transistors
Crossref DOI link: https://doi.org/10.1007/s13391-020-00229-w
Published Online: 2020-06-24
Published Print: 2020-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mallem, Siva Pratap Reddy
Im, Ki-Sik
Thingujam, Terirama
Lee, Jung-Hee http://orcid.org/0000-0002-4785-3006
Caulmilone, Raphael
Cristoloveanu, Sorin
Text and Data Mining valid from 2020-06-24
Version of Record valid from 2020-06-24
Article History
Received: 11 February 2020
Accepted: 15 June 2020
First Online: 24 June 2020