Qualifying Electrically Conductive Cold Embedding-Media for Scanning Electron Microscopy
Crossref DOI link: https://doi.org/10.1007/s13632-016-0286-9
Published Online: 2016-05-10
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Besserer, Hans-Bernward
Boiarkin, Viacheslav
Rodman, Dmytro
Nürnberger, Florian
Text and Data Mining valid from 2016-05-10