Finding the cause of degradation of low-temperature oxide thin-film transistors
Crossref DOI link: https://doi.org/10.1007/s40042-021-00069-3
Published Online: 2021-01-20
Published Print: 2021-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jeong, Ho-young
Nam, Seung-hee
Park, Kwon-shik
Choi, Hyun-chul
Jang, Jin
Text and Data Mining valid from 2021-01-20
Version of Record valid from 2021-01-20
Article History
Received: 28 October 2020
Revised: 24 November 2020
Accepted: 4 December 2020
First Online: 20 January 2021