Stability and electronic structure of stacking faults and polytypes in $${\hbox {ZnSnN}_2}$$, $${\hbox {ZnGeN}_2}$$, and $${\hbox {ZnSiN}_2}$$
Crossref DOI link: https://doi.org/10.1007/s40042-021-00204-0
Published Online: 2021-05-28
Published Print: 2021-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jeong, Byeong-Hyeon
Park, Ji-Sang
Text and Data Mining valid from 2021-05-28
Version of Record valid from 2021-05-28
Article History
Received: 16 March 2021
Revised: 7 April 2021
Accepted: 13 April 2021
First Online: 28 May 2021
Declarations
:
: The authors declare that they have no conflict of interest.