Characterization of nanocrystalline nickel oxide thin films prepared at different thermal oxidation temperatures
Crossref DOI link: https://doi.org/10.1007/s40097-020-00332-2
Published Online: 2020-02-03
Published Print: 2020-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hajakbari, Fatemeh
Text and Data Mining valid from 2020-02-03
Version of Record valid from 2020-02-03
Article History
Received: 19 July 2019
Accepted: 22 January 2020
First Online: 3 February 2020