Influence of resolution on the X-ray CT-based measurements of metallic AM lattice structures
Crossref DOI link: https://doi.org/10.1007/s40194-020-00920-4
Published Online: 2020-05-26
Published Print: 2020-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rathore, Jitendra Singh http://orcid.org/0000-0002-9918-3411
Vienne, Caroline
Quinsat, Yann
Tournier, Christophe
Text and Data Mining valid from 2020-05-26
Version of Record valid from 2020-05-26
Article History
Received: 15 October 2019
Accepted: 7 May 2020
First Online: 26 May 2020