Influence of Annealing Temperature on the Microstructure and Electrical Properties of Indium Tin Oxide Thin Films
Crossref DOI link: https://doi.org/10.1007/s40195-014-0059-x
Published Online: 2014-04-19
Published Print: 2014-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Yinzhi
Jiang, Hongchuan
Jiang, Shuwen
Liu, Xingzhao
Zhang, Wanli
Zhang, Qinyong
Text and Data Mining valid from 2014-04-01