Effect of Al2O3 Buffer Layers on the Properties of Sputtered VO2 Thin Films
Crossref DOI link: https://doi.org/10.1007/s40820-017-0132-x
Published Online: 2017-02-14
Published Print: 2017-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhang, Dainan
Wen, Tianlong
Xiong, Ying
Qiu, Donghong
Wen, Qiye
License valid from 2017-02-14