Electromigration Effects During Resistance Brazing of Zn–Al/Al System
Crossref DOI link: https://doi.org/10.1007/s40962-019-00313-4
Published Online: 2019-02-12
Published Print: 2019-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yu, Wei-yuan
Wu, Wei-jie
Lin, Qiao-li
Sun, Xue-min
Text and Data Mining valid from 2019-02-12
Article History
First Online: 12 February 2019
Compliance with Ethical Standards
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: The authors have no conflict of interest to declare.