Investigation of sensitivity and threshold voltage shift of commercial MOSFETs in gamma irradiation
Crossref DOI link: https://doi.org/10.1007/s41365-016-0149-8
Published Online: 2016-10-31
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ashrafi, Saleh
Eslami, Baharak
License valid from 2016-10-31