α-Decay half-life screened by electrons
Crossref DOI link: https://doi.org/10.1007/s41365-016-0150-2
Published Online: 2016-10-31
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wan, Niu
Xu, Chang
Ren, Zhong-Zhou
License valid from 2016-10-31