Identifying defect energy levels using DLTS under different electron irradiation conditions
Crossref DOI link: https://doi.org/10.1007/s41365-017-0331-7
Published Online: 2017-11-28
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Guo, Chun-Sheng
Wang, Ruo-Min
Zhang, Yu-Wei
Pei, Guo-Xi
Feng, Shi-Wei
Li, Zhao-Xian
License valid from 2017-11-28