Automated Defective Pin Detection for Recycled Microelectronics Identification
Crossref DOI link: https://doi.org/10.1007/s41635-019-00069-7
Published Online: 2019-05-08
Published Print: 2019-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ghosh, Pallabi
Bhattacharya, Aritra
Forte, Domenic
Chakraborty, Rajat Subhra http://orcid.org/0000-0003-3588-163X
Text and Data Mining valid from 2019-05-08
Article History
Received: 7 August 2018
Accepted: 4 April 2019
First Online: 8 May 2019