Total Ionization Dose (TID) Effects on 2D MOS Devices
Crossref DOI link: https://doi.org/10.1007/s42341-020-00255-3
Published Online: 2020-11-02
Published Print: 2021-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bala, Shashi http://orcid.org/0000-0003-2859-7702
Kumar, Raj
Kumar, Arvind
Text and Data Mining valid from 2020-11-02
Version of Record valid from 2020-11-02
Article History
Received: 5 September 2020
Revised: 21 October 2020
Accepted: 24 October 2020
First Online: 2 November 2020
Compliance with Ethical Standards
:
: Authors declare that there is no conflict of interest and no funding applicable.