Extensive Analysis of Gate Leakage Current in Nano-Scale Multi-gate MOSFETs
Crossref DOI link: https://doi.org/10.1007/s42341-022-00404-w
Published Online: 2022-06-13
Published Print: 2022-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yadav, Shekhar
Kumar, Hemant
Negi, Chandra Mohan Singh http://orcid.org/0000-0003-2388-9511
Text and Data Mining valid from 2022-06-13
Version of Record valid from 2022-06-13
Article History
Received: 4 October 2021
Revised: 1 May 2022
Accepted: 19 May 2022
First Online: 13 June 2022
Declarations
:
: The authors declare that they have no conflict of interest.