Influence of bias voltage on structure, mechanical and corrosion properties of reactively sputtered nanocrystalline TiN films
Crossref DOI link: https://doi.org/10.1016/S1006-706X(18)30021-9
Published Online: 2017-12-01
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
He, Chun-lin
Zhang, Jin-lin
Ma, Guo-feng
Du, Zhao-fu
Wang, Jian-ming
Zhao, Dong-liang
License valid from 2017-12-01