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Photometry unlocks 3D information from 2D localization microscopy data

Crossref DOI link: https://doi.org/10.1038/nmeth.4073

Published Online: 2016-11-21

Published Print: 2017-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Franke, Christian

Sauer, Markus

van de Linde, Sebastian
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Text and Data Mining valid from 2016-11-21
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Article History

Received: 15 July 2016

Accepted: 16 October 2016

First Online: 21 November 2016

Competing interests

: C.F., M.S. and S.v.d.L. are in the process of filing a patent application.