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Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

Crossref DOI link: https://doi.org/10.1038/s41377-021-00524-7

Published Online: 2021-04-15

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Qin, Ting-Xiao

You, En-Ming

Zhang, Mao-Xin

Zheng, Peng

Huang, Xiao-Feng

Ding, Song-Yuan https://orcid.org/0000-0002-1862-0713
Mao, Bing-Wei

Tian, Zhong-Qun https://orcid.org/0000-0002-9775-8189
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (21872115)

National Natural Science Foundation of China (21902135)

National Natural Science Foundation of China (21727807)

China Postdoctoral Science Foundation (2019M652251)

Ministry of Science and Technology of the People’s Republic of China (2016YFA0200703)
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Article History

Received: 10 November 2020

Revised: 24 March 2021

Accepted: 29 March 2021

First Online: 15 April 2021

Conflict of interest

: The authors declare no competing interests.

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