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Correction: Deep learning in optical metrology: a review

Crossref DOI link: https://doi.org/10.1038/s41377-022-00757-0

Published Online: 2022-03-27

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Zuo, Chao https://orcid.org/0000-0002-1461-0032
Qian, Jiaming https://orcid.org/0000-0002-9110-4950
Feng, Shijie

Yin, Wei https://orcid.org/0000-0002-9148-3401
Li, Yixuan

Fan, Pengfei

Han, Jing

Qian, Kemao

Chen, Qian
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Text and Data Mining valid from 2022-03-27

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First Online: 27 March 2022