Deep learning augmented microscopy: a faster, wider view, higher resolution autofluorescence-harmonic microscopy
Crossref DOI link: https://doi.org/10.1038/s41377-022-00801-z
Published Online: 2022-04-24
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tian, Lei https://orcid.org/0000-0002-1316-4456
Text and Data Mining valid from 2022-04-24
Version of Record valid from 2022-04-24
Article History
First Online: 24 April 2022
Conflict of interest
: The authors declare no competing interests.