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Enabling thin-film transistor technologies and the device metrics that matter

Crossref DOI link: https://doi.org/10.1038/s41467-018-07424-2

Published Online: 2018-12-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Paterson, Alexandra F.

Anthopoulos, Thomas D. https://orcid.org/0000-0002-0978-8813
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Text and Data Mining valid from 2018-12-10

Version of Record valid from 2018-12-10
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Article History

Received: 23 May 2018

Accepted: 27 August 2018

First Online: 10 December 2018

Competing interests

: The authors declare no competing interests.