Yeom, Huiran https://orcid.org/0000-0001-8836-2249
Lee, Yonghee https://orcid.org/0000-0001-8095-408X
Ryu, Taehoon
Noh, Jinsung https://orcid.org/0000-0002-7167-8113
Lee, Amos Chungwon https://orcid.org/0000-0002-0350-7080
Lee, Han-Byoel https://orcid.org/0000-0003-0152-575X
Kang, Eunji
Song, Seo Woo
Kwon, Sunghoon
Article History
Received: 26 October 2018
Accepted: 30 January 2019
First Online: 28 February 2019
Competing interests
: S.K., H.Y., Y.L., T.R. and J.N. are authors of a patent application for the method described in this paper (Method for identifying errors occurred by massively parallel sequencing and an apparatus for the same Method for identifying errors occurred by massively parallel sequencing and an apparatus for the same, KR20170119295A, 2016.04.15). The remaining authors declare no competing interests.