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Nano-crumples induced Sn-Bi bimetallic interface pattern with moderate electron bank for highly efficient CO2 electroreduction

Crossref DOI link: https://doi.org/10.1038/s41467-022-29861-w

Published Online: 2022-05-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Ren, Bohua

Wen, Guobin

Gao, Rui

Luo, Dan https://orcid.org/0000-0001-9289-888X
Zhang, Zhen

Qiu, Weibin

Ma, Qianyi

Wang, Xin https://orcid.org/0000-0002-4771-8453
Cui, Yi https://orcid.org/0000-0002-9182-9038
Ricardez–Sandoval, Luis https://orcid.org/0000-0001-9867-6778
Yu, Aiping https://orcid.org/0000-0002-7422-7537
Chen, Zhongwei https://orcid.org/0000-0003-3463-5509
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Text and Data Mining valid from 2022-05-05

Version of Record valid from 2022-05-05
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Article History

Received: 4 August 2021

Accepted: 4 April 2022

First Online: 5 May 2022

Competing interests

: The authors declare no competing interests.