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Twinning mediated intralayer frustration governs structural degradation in layered Li-rich oxide cathode

Crossref DOI link: https://doi.org/10.1038/s41467-025-61386-w

Published Online: 2025-07-17

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Yang, Tingting

Yang, Maolin

Huang, Zhongyuan https://orcid.org/0000-0002-9488-0760
Wang, Rui https://orcid.org/0009-0008-6199-0374
Ji, Wenhai

Lu, Peng-Han

Zeng, Tao

Li, Zenan

Wang, Jun https://orcid.org/0000-0001-9561-5857
Dunin-Borkowski, Rafal E. https://orcid.org/0000-0001-8082-0647
Jin, Lei https://orcid.org/0000-0001-6924-2364
Xiao, Yinguo https://orcid.org/0000-0001-9306-908X
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Text and Data Mining valid from 2025-07-17

Version of Record valid from 2025-07-17
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Article History

Received: 4 August 2024

Accepted: 19 June 2025

First Online: 17 July 2025

Competing interests

: The authors declare no competing interests.