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Uncertainty-aware particle segmentation for electron microscopy at varied length scales

Crossref DOI link: https://doi.org/10.1038/s41524-024-01302-w

Published Online: 2024-06-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Rettenberger, Luca https://orcid.org/0000-0002-7416-1902
Szymanski, Nathan J. https://orcid.org/0000-0003-2255-9676
Zeng, Yan https://orcid.org/0000-0002-5831-1210
Schuetzke, Jan https://orcid.org/0000-0001-5816-4866
Wang, Shilong https://orcid.org/0009-0004-8504-5802
Ceder, Gerbrand https://orcid.org/0000-0001-9275-3605
Reischl, Markus https://orcid.org/0000-0002-7780-6374
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Text and Data Mining valid from 2024-06-12

Version of Record valid from 2024-06-12
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Article History

Received: 5 December 2023

Accepted: 24 May 2024

First Online: 12 June 2024

Competing interests

: The authors declare no competing interests.