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Author Correction: Heuristic solution for achieving long-term cycle stability for Ni-rich layered cathodes at full depth of discharge

Crossref DOI link: https://doi.org/10.1038/s41560-020-00760-y

Published Online: 2020-12-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kim, Un-Hyuck https://orcid.org/0000-0002-1644-9473
Park, Geon-Tae

Son, Byoung-Ki

Nam, Gyeong Won

Liu, Jun https://orcid.org/0000-0001-8663-7771
Kuo, Liang-Yin

Kaghazchi, Payam https://orcid.org/0000-0002-1541-7760
Yoon, Chong S. https://orcid.org/0000-0001-6164-3331
Sun, Yang-Kook https://orcid.org/0000-0002-0117-0170
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First Online: 9 December 2020

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